PIERS —— A global symposium committed to
advancing photonics and electromagnetics for the benefit of humanity.
Presenting Author | Talk Time | Paper Title | Authors | Abstract | Session Date / Room |
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00:00 Onsite Invited |
Ultrasensitive Full-field Dynamic Light Scattering Microscopy Reveals Nanoscopic Cell Organization and Dynamics View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Invited |
Quantitative Label-free Imaging of Protein Diffusion and Interaction at the Single Molecule Level View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Invited |
Quantitative Plasmonic Microscopy towards Single Molecule Detection View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Keynote |
Pixel-diversity Interferometric Imaging: A New Paradigm in Digital Biosensing View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Invited |
Substrate Signature in Interferometric Scattering Microscopy: Identification, Metrology Implication and Its Removal View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Invited |
Optical Phase Imaging and Phase Shaping with Coherent and Incoherent Light View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Invited |
Advancing Single Molecule Localization Microscopy: New Devices, New Methods and New Possibilities View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Invited |
Optical Wafer Inspection at Advanced Technology Nodes View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite |
Optical Characterization of Low-loss Phase Change Material Sb2S3 Based on Quantitative Phase Microscopy View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite |
Optical Measurement of Photonic Nanostructures Based on Quantitative Phase Microscopy View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite |
Far-field Deep Sub-wavelength Defect Inspection Using Structured Light Field Illumination Microscopy View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Invited |
Compact Microscopic System for Long-term 3D Imaging and Quantitative Analysis of Organoids View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Invited |
Plasmon-enhanced Fluorophores for Superresolution Microscopy: Opportunities and Challenges View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Invited |
Quantitative Phase Imaging at the Nanoscale Using Interferometric Scattering Microscope View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite |
A Combination of Interferometric Scattering Microscopy and Raman Spectroscopy with a Single-molecule Sensitivity Reveals the Dynamics of Plasmon-driven Reactions View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Invited |
Exploring Phase Spatial Resolution Limit in Quantitative Phase Microscopy View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Invited |
Single-molecule Fluorescence Multiplexing by Multi-parameter Spectroscopic Detection of Nanostructured FRET Labels View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Invited |
Beam Shaping and Measurement Based on All-integrated Reconfigurable Meshes --- A New Tool for Microscopy View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite Keynote |
Interferometric Scattering Detection and Microscopy View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite |
Discriminative Non-destructive Testing from Different Chip Layers by Photoacoustic Remote Sensing View Abstract] | [
0000-00-00 Room: |
|
00:00 Onsite |
Multiscale Modeling and Analysis for High-fidelity Interferometric Scattering Microscopy View Abstract] | [
0000-00-00 Room: |
Inquiry about paper submission, registration, and program schedule, please email to:
PIERS OFFICE: office@piers.org and/or office@emwave.cn
Usually, inquiry to PIERS OFFICE will be replied within 1-2 working days. If you cannot get reply timely, please keep trying both emails, or change another email account to contact us to avoid the unpredictable email correspondence problem between us.