3_FocusSession.SC3: Optical Microscopy for Quantitative Imaging and Metrology

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3_FocusSession.SC3: Optical Microscopy for Quantitative Imaging and Metrology

Session Organizers

Xuewen Chen

Huazhong University of Science and Technology

China

Marek Piliarik

Institute of Photonics and Electronics of the CAS

Czech Republic

Session Infomation

Optical microscopy techniques have been progressing at a spectacular pace for a wide range of applications, in particular, developing from seeing or demonstration of principle to quantitative imaging and precision measurements. This session aims to capture the latest advances of principles and techniques in optical microscopy for quantitative imaging, high-sensitivity detection and localization of biological/chemical processes, and metrology at the deep nanoscopic length scale.

Submitted Articles

Note: The following submitted articles are not guaranteed to be scheduled in the final program at this stage. The final presentation type and arranged session will be decided by Technical Program Committee.

Talk Time	Paper Title \| Authors \| Abstract	Session Date / Room
00:00 Onsite Invited	Ultrasensitive Full-field Dynamic Light Scattering Microscopy Reveals Nanoscopic Cell Organization and Dynamics *Chia-Lung Hsieh (Institute of Atomic and Molecular Sciences (IAMS), Academia Sinica) [View Abstract]	0000-00-00 Room:
00:00 Onsite Invited	Quantitative Label-free Imaging of Protein Diffusion and Interaction at the Single Molecule Level *Barbora Spackova (Institute of Physics of the Czech Academy of Sciences) [View Abstract]	0000-00-00 Room:
00:00 Onsite Invited	Quantitative Plasmonic Microscopy towards Single Molecule Detection *Hui Yu (Shanghai Jiao Tong University) [View Abstract]	0000-00-00 Room:
00:00 Onsite Keynote	Pixel-diversity Interferometric Imaging: A New Paradigm in Digital Biosensing *M. Selim Unlu (Boston University) Iris Celebi (Boston University) Mete Aslan (Boston University) [View Abstract]	0000-00-00 Room:
00:00 Onsite Invited	Substrate Signature in Interferometric Scattering Microscopy: Identification, Metrology Implication and Its Removal *Xuewen Chen (Huazhong University of Science and Technology) [View Abstract]	0000-00-00 Room:
00:00 Onsite Invited	Optical Phase Imaging and Phase Shaping with Coherent and Incoherent Light Anis Aggoun (Sorbonne Université) Jose M. Panadés (Sorbonne Université) Hadrien M. L. Robert (Sorbonne Université) Benoit Rogez (Sorbonne Université) Pascal Berto (Sorbonne Université) *Gilles Tessier (Sorbonne Université) [View Abstract]	0000-00-00 Room:
00:00 Onsite Invited	Advancing Single Molecule Localization Microscopy: New Devices, New Methods and New Possibilities *Zhen-Li Huang (Hainan University) [View Abstract]	0000-00-00 Room:
00:00 Onsite Invited	Optical Wafer Inspection at Advanced Technology Nodes *Jinlong Zhu (Huazhong University of Science and Technology) Jiamin Liu (Huazhong University of Science and Technology) Honggang Gu (Huazhong University of Science and Technology) Hao Jiang (Beihang University) Shiyuan Liu (Huazhong University of Science and Technology) [View Abstract]	0000-00-00 Room:
00:00 Onsite	Optical Characterization of Low-loss Phase Change Material Sb2S3 Based on Quantitative Phase Microscopy Wenyu Chen (Huazhong University of Science and Technology) Yu Zhe (Huazhong University of Science and Technology) Shiyuan Liu (Huazhong University of Science and Technology) *Jinlong Zhu (Huazhong University of Science and Technology) [View Abstract]	0000-00-00 Room:
00:00 Onsite	Optical Measurement of Photonic Nanostructures Based on Quantitative Phase Microscopy Zedi Li (Huazhong University of Science and Technology) Yijun Xie (Hubei University of Technology) Renlong Zhu (Hubei University of Technology) Jingyi Wang (Hubei University of Technology) Zhengqiong Dong (Hubei University of Technology) Xiangdong Zhou (Hubei University of Technology) Lei Nie (Hubei University of Technology) Shiyuan Liu (Huazhong University of Science and Technology) *Jinlong Zhu (Huazhong University of Science and Technology) [View Abstract]	0000-00-00 Room:
00:00 Onsite	Far-field Deep Sub-wavelength Defect Inspection Using Structured Light Field Illumination Microscopy Jinsong Zhang (Huazhong University of Science and Technology) Shiyuan Liu (Huazhong University of Science and Technology) *Jinlong Zhu (Huazhong University of Science and Technology) [View Abstract]	0000-00-00 Room:
00:00 Onsite Invited	Compact Microscopic System for Long-term 3D Imaging and Quantitative Analysis of Organoids *Yuting Yang (Shanghai Jiao Tong University) [View Abstract]	0000-00-00 Room:
00:00 Onsite Invited	Plasmon-enhanced Fluorophores for Superresolution Microscopy: Opportunities and Challenges Niklas Hansen (J. Heyrovský Institute of Physical Chemistry Czech Academy of Sciences) Miroslav Hekrdla (J. Heyrovský Institute of Physical Chemistry Czech Academy of Sciences) David Roesel (J. Heyrovský Institute of Physical Chemistry Czech Academy of Sciences) Soumya Frederick (J. Heyrovský Institute of Physical Chemistry Czech Academy of Sciences) Khalillulah Umar (J. Heyrovský Institute of Physical Chemistry Czech Academy of Sciences) Jakub Čopák (Institute of Chemistry and Biochemistry Czech Academy of Sciences) Marek Kindermann (Institute of Chemistry and Biochemistry Czech Academy of Sciences) Petr Cígler (Institute of Chemistry and Biochemistry Czech Academy of Sciences) *Vladimíra Petráková (J. Heyrovský Institute of Physical Chemistry Czech Academy of Sciences) [View Abstract]	0000-00-00 Room:
00:00 Onsite Invited	Quantitative Phase Imaging at the Nanoscale Using Interferometric Scattering Microscope *Marek Piliarik (Institute of Photonics and Electronics of the CAS) [View Abstract]	0000-00-00 Room:
00:00 Onsite	A Combination of Interferometric Scattering Microscopy and Raman Spectroscopy with a Single-molecule Sensitivity Reveals the Dynamics of Plasmon-driven Reactions *David Palounek (Institute of Photonics and Electronics of the CAS) Ivan Kopal (Institute of Photonics and Electronics of the CAS) Milan Vala (Institute of Photonics and Electronics of the CAS) Marek Piliarik (Institute of Photonics and Electronics of the CAS) [View Abstract]	0000-00-00 Room:
00:00 Onsite Invited	Exploring Phase Spatial Resolution Limit in Quantitative Phase Microscopy *Renjie Zhou (The Chinese University of Hong Kong) Nansen Zhou (The Chinese University of Hong Kong) [View Abstract]	0000-00-00 Room:
00:00 Onsite Invited	Single-molecule Fluorescence Multiplexing by Multi-parameter Spectroscopic Detection of Nanostructured FRET Labels *Allison H. Squires (University of Chicago) Jiachong Chu (University of Chicago) Ayesha Ejaz (University of Chicago) [View Abstract]	0000-00-00 Room:
00:00 Onsite Invited	Beam Shaping and Measurement Based on All-integrated Reconfigurable Meshes --- A New Tool for Microscopy *Peter Banzer (University of Graz) J. Bütow (University of Graz) V. Sharma (University of Graz) D. Brandmüller (University of Graz) J. S. Eismann (Max Planck Institute for the Science of Light) [View Abstract]	0000-00-00 Room:
00:00 Onsite Keynote	Interferometric Scattering Detection and Microscopy *Vahid Sandoghdar (Max-Planck-Institute for the Science of Light) [View Abstract]	0000-00-00 Room:
00:00 Onsite	Discriminative Non-destructive Testing from Different Chip Layers by Photoacoustic Remote Sensing *Jijing Chen (Tianjin University) Yihan Pi (Tianjin University) Jiao Li (Tianjin University) Zhen Tian (Tianjin University) [View Abstract]	0000-00-00 Room:
00:00 Onsite	Multiscale Modeling and Analysis for High-fidelity Interferometric Scattering Microscopy *Shupei Lin (Huazhong University of Science and Technology) Pu Zhang (Huazhong University of Science and Technology) Marek Piliarik (Institute of Photonics and Electronics of the CAS) Xuewen Chen (Huazhong University of Science and Technology) [View Abstract]	0000-00-00 Room:

3_FocusSession.SC3: Optical Microscopy for Quantitative Imaging and Metrology

Session Organizers

Session Infomation

Submitted Articles

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